DocumentCode
3170293
Title
Gate controlled surface tunneling transistor
Author
Reddick, William M. ; Amaratunga, Gehan A J
Author_Institution
Dept. of Eng., Cambridge Univ., UK
fYear
1995
fDate
7-9 Aug 1995
Firstpage
490
Lastpage
497
Abstract
A three terminal, field effect silicon surface tunneling transistor (STT) is presented. The device incorporates lateral band-to-band tunneling as the current conduction process. This lateral band-to-band tunneling is controlled by the application of a gate bias. Two-dimensional computer simulations and experimental results verify the operation of the device. The drain current is found to vary exponentially with respect to both the drain voltage and gate voltage. The drain current´s exponential relationship to the gate voltage may prove useful to signal detector type applications. Temperature dependence characteristics and switching performance for the device are also presented
Keywords
MOSFET; quantum interference devices; semiconductor device models; tunnel transistors; current conduction process; drain current; drain voltage; gate controlled p-n junction diode; gate controlled surface tunneling transistor; gate voltage; lateral band-to-band tunneling; signal detector applications; switching performance; temperature dependence characteristics; three terminal field effect silicon surface tunneling transistor; two-dimensional computer simulations; Application software; Computer simulation; Detectors; FETs; Immune system; MOSFET circuits; Signal detection; Silicon; Tunneling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
High Speed Semiconductor Devices and Circuits, 1995. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
Conference_Location
Ithaca, NY
ISSN
1079-4700
Print_ISBN
0-7803-3970-3
Type
conf
DOI
10.1109/CORNEL.1995.482545
Filename
482545
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