DocumentCode
3170377
Title
A 200 MHz CMOS phase-locked loop with dual phase detectors
Author
Ware, K.M. ; Lee, H.-S. ; Sodini, C.G.
Author_Institution
MIT, Cambridge, MA, USA
fYear
1989
fDate
15-17 Feb. 1989
Firstpage
192
Lastpage
193
Abstract
The authors describe a 200-MHz PLL (phase-locked loop) in a 2- mu m CMOS technology employing an untrimmed current-controlled ring oscillator (CCO). Two phase detectors are included: a phase-frequency detector (PFD) for fast acquisition during data preamble (100% pulse density), and a mixer phase detector to lock on actual data (in the presence of missing pulses). Simulation results and experimental data using an external current source suggest that using the bandgap reference, the CCO supply sensitivity will be 4%/V and the CCO temperature coefficient will be about 500 p.p.m./ degrees C. Internal input and output waveforms in lock were measured from buffered test pads with a low-capacitance wideband buffered probe.<>
Keywords
CMOS integrated circuits; detector circuits; linear integrated circuits; phase-locked loops; 2 micron; 200 MHz; CMOS technology; PLL; bandgap reference; dual phase detectors; mixer phase detector; monolithic IC; phase-frequency detector; phase-locked loop; untrimmed current-controlled ring oscillator; CMOS technology; Current measurement; Phase detection; Phase frequency detector; Phase locked loops; Photonic band gap; Ring oscillators; Temperature sensors; Testing; Wideband;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1989. Digest of Technical Papers. 36th ISSCC., 1989 IEEE International
Conference_Location
New York, NY, USA
Type
conf
DOI
10.1109/ISSCC.1989.48255
Filename
48255
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