• DocumentCode
    3170377
  • Title

    A 200 MHz CMOS phase-locked loop with dual phase detectors

  • Author

    Ware, K.M. ; Lee, H.-S. ; Sodini, C.G.

  • Author_Institution
    MIT, Cambridge, MA, USA
  • fYear
    1989
  • fDate
    15-17 Feb. 1989
  • Firstpage
    192
  • Lastpage
    193
  • Abstract
    The authors describe a 200-MHz PLL (phase-locked loop) in a 2- mu m CMOS technology employing an untrimmed current-controlled ring oscillator (CCO). Two phase detectors are included: a phase-frequency detector (PFD) for fast acquisition during data preamble (100% pulse density), and a mixer phase detector to lock on actual data (in the presence of missing pulses). Simulation results and experimental data using an external current source suggest that using the bandgap reference, the CCO supply sensitivity will be 4%/V and the CCO temperature coefficient will be about 500 p.p.m./ degrees C. Internal input and output waveforms in lock were measured from buffered test pads with a low-capacitance wideband buffered probe.<>
  • Keywords
    CMOS integrated circuits; detector circuits; linear integrated circuits; phase-locked loops; 2 micron; 200 MHz; CMOS technology; PLL; bandgap reference; dual phase detectors; mixer phase detector; monolithic IC; phase-frequency detector; phase-locked loop; untrimmed current-controlled ring oscillator; CMOS technology; Current measurement; Phase detection; Phase frequency detector; Phase locked loops; Photonic band gap; Ring oscillators; Temperature sensors; Testing; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1989. Digest of Technical Papers. 36th ISSCC., 1989 IEEE International
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1989.48255
  • Filename
    48255