Title :
On the relationship between fault-masking and multiple-line redundancies in combinational circuits
Author :
Evans, Allison H. ; Macii, Enrico
Author_Institution :
Dept. of Comput. Sci., California Univ., San Diego, La Jolla, CA, USA
Abstract :
In this paper we present necessary and sufficient conditions for the undetectability of multiple faults in combinational circuits. Then, we study the relationship between fault-masking and multiple-line redundancies
Keywords :
combinational circuits; logic testing; redundancy; combinational circuits; fault-masking; multiple faults; multiple-line redundancies; undetectability; Combinational logic circuit testing; Redundancy;
Conference_Titel :
Electrical and Computer Engineering, 1994. Conference Proceedings. 1994 Canadian Conference on
Conference_Location :
Halifax, NS
Print_ISBN :
0-7803-2416-1
DOI :
10.1109/CCECE.1994.405831
