DocumentCode :
3171278
Title :
Robust ADC concept for integrated CMOS systems
Author :
Eklund, Jan-Erik
Author_Institution :
Ericsson Components AB, Stockholm, Sweden
fYear :
1999
fDate :
1999
Firstpage :
126
Lastpage :
129
Abstract :
The ADC is found to be very robust against electrical noise in the substrate and from the output pads. Whether the square wave signal test is representative or not, the PSA-ADC can stand high (>1 V) disturbing signals in the substrate and is therefore suitable for systems integration. The noise and linearity measurements clearly shows that a PSA-ADC with 12-bit resolution is feasible. This ADC can easily be adapted to various applications with different requirements. Only the comparators are analog and need some care. The number of cells and subranging stages can be adjusted to meet a specific requirement in terms of speed and resolution. This together with the noise immunity and the scalability makes this ADC suitable for systems integration
Keywords :
CMOS integrated circuits; ADC; electrical noise; integrated CMOS systems; linearity measurements; resolution; scalability; speed; square wave signal test; subranging stages; systems integration;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Advanced A/D and D/A Conversion Techniques and Their Applications, 1999. Third International Conference on (Conf. Publ. No. 466)
Conference_Location :
Glasgow
ISSN :
0537-9989
Print_ISBN :
0-85296-718-7
Type :
conf
DOI :
10.1049/cp:19990480
Filename :
794003
Link To Document :
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