Title :
Modeling circuit variability
Author_Institution :
IBM, Bangalore
Abstract :
In order to design integrated circuits which can be manufactured with high yield the variations which can occur during manufacturing must be included with the compact models. The manufacturing variations comprise a complex correlated set of statistical distributions. This paper presents some of the current options and challenges in modeling variation. Improving the prediction of statistical circuit behavior will require coordinated improvement in models, netlisting tools and simulators.
Keywords :
integrated circuit design; integrated circuit modelling; statistical distributions; circuit variability; integrated circuits design; manufacturing variations; netlisting tools; statistical distributions; Circuit simulation; FETs; Integrated circuit manufacture; Integrated circuit modeling; Integrated circuit yield; Mathematical model; Predictive models; Shape measurement; Statistical distributions; Virtual manufacturing; Circuit Simulation; Compact Models; Process Variability; Statistical Models;
Conference_Titel :
Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on
Conference_Location :
Mumbai
Print_ISBN :
978-1-4244-1728-5
Electronic_ISBN :
978-1-4244-1728-5
DOI :
10.1109/IWPSD.2007.4472454
