DocumentCode
3171315
Title
Modeling circuit variability
Author
Watts, Josef
Author_Institution
IBM, Bangalore
fYear
2007
fDate
16-20 Dec. 2007
Firstpage
57
Lastpage
61
Abstract
In order to design integrated circuits which can be manufactured with high yield the variations which can occur during manufacturing must be included with the compact models. The manufacturing variations comprise a complex correlated set of statistical distributions. This paper presents some of the current options and challenges in modeling variation. Improving the prediction of statistical circuit behavior will require coordinated improvement in models, netlisting tools and simulators.
Keywords
integrated circuit design; integrated circuit modelling; statistical distributions; circuit variability; integrated circuits design; manufacturing variations; netlisting tools; statistical distributions; Circuit simulation; FETs; Integrated circuit manufacture; Integrated circuit modeling; Integrated circuit yield; Mathematical model; Predictive models; Shape measurement; Statistical distributions; Virtual manufacturing; Circuit Simulation; Compact Models; Process Variability; Statistical Models;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on
Conference_Location
Mumbai
Print_ISBN
978-1-4244-1728-5
Electronic_ISBN
978-1-4244-1728-5
Type
conf
DOI
10.1109/IWPSD.2007.4472454
Filename
4472454
Link To Document