• DocumentCode
    3171356
  • Title

    Propagating variability from technology to system level

  • Author

    Dierickx, Bart ; Miranda, Miguel ; Dobrovolny, Petr ; Kutscherauer, Florian ; Papanikolaou, Antonis ; Marchal, Pol

  • Author_Institution
    IMEC, Leuven
  • fYear
    2007
  • fDate
    16-20 Dec. 2007
  • Firstpage
    74
  • Lastpage
    79
  • Abstract
    As CMOS technology feature sizes decrease, variability more and more jeopardizes system level parametric and functional yield. This paper proposes a framework that can capture variability at all levels in the design flow. It offers a correlated view on yield, timing, dynamic and static energy. Preservation on rare events in variability distributions is obtained by the Weighted Monte Carlo technique.
  • Keywords
    CMOS integrated circuits; Monte Carlo methods; CMOS technology; functional yield; system level; variability; weighted Monte Carlo technique; CMOS technology; Circuits; Design for manufacture; Frequency estimation; Monte Carlo methods; Optical distortion; Shape; Timing; Virtual manufacturing; Yield estimation; Weighted Monte Carlo; system level; technology aware design; variability; variability aware modeling; yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on
  • Conference_Location
    Mumbai
  • Print_ISBN
    978-1-4244-1728-5
  • Electronic_ISBN
    978-1-4244-1728-5
  • Type

    conf

  • DOI
    10.1109/IWPSD.2007.4472457
  • Filename
    4472457
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3171356