• DocumentCode
    3171582
  • Title

    Experimental analysis of the effect of substrate noise on PLL performance

  • Author

    Jenkins, Keith A. ; Rhee, Woogeun ; Liobe, John ; Ainspan, Herschel

  • Author_Institution
    T.J. Watson Res. Center, IBM, Yorktown Heights, NY
  • fYear
    2006
  • fDate
    18-20 Jan. 2006
  • Abstract
    A novel approach is used to identify the substrate-noise sensitive components of a phase-locked loop (PLL) using a tank (LC) voltage controlled oscillator (VCO). Using passive noise injection pads capacitively connected to the substrate, continuous wave (CW) noise is injected into the substrate. The frequency response of the PLL is measured as noise is injected near dc, near the reference clock frequency, and near the VCO frequency. Analyzing the spurs seen in a spectrum analyzer leads to the conclusion that the other PLL blocks can be more sensitive to substrate noise coupling than the VCO, depending on the substrate noise frequency
  • Keywords
    frequency response; integrated circuit noise; phase locked loops; phase noise; spectral analysers; voltage-controlled oscillators; VCO frequency; continuous wave noise; frequency response; passive noise injection pads; phase-locked loop; reference clock frequency; spectrum analyzer; substrate noise coupling; substrate noise effect; substrate noise frequency; voltage controlled oscillator; Circuit noise; Coupling circuits; Frequency; Low-frequency noise; Noise generators; Noise measurement; Performance analysis; Phase locked loops; Phase noise; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Monolithic Integrated Circuits in RF Systems, 2006. Digest of Papers. 2006 Topical Meeting on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-9472-0
  • Type

    conf

  • DOI
    10.1109/SMIC.2005.1587903
  • Filename
    1587903