DocumentCode :
3171617
Title :
0.13/spl mu/m CMOS SOI SP6T antenna switch for multi-standard handsets
Author :
Tinella, C. ; Richard, O. ; Cathelin, A. ; Réauté, F. ; Majcherczak, S. ; Blanchet, F. ; Belot, D.
Author_Institution :
STMicroelectronics, Crolles
fYear :
2006
fDate :
18-20 Jan. 2006
Abstract :
This paper presents the design of a single pole 6 throw antenna switch able to manage all the four GSM standards, i.e. 850-900-1800-1900 MHz. The switch has been integrated in a 0.13mum CMOS SOI process with high resistivity substrate and a thick oxide (50Aring) option. The use of high resistivity substrate allows a good loss (IL)-isolation trade-off: IL is kept in the range of 0.55-0.8 dB for the RXs and at 0.7 dB for the TXs, while isolation varies from 40 dB at 900 MHz to 30 dB at 1900 MHz. Power handling capability is well compatible with GSM standards since an ICP0.1dB of 36 dBm has been measured and harmonics distortion is below -39 dBm for an input power of 34 dBm. Robustness to antenna mismatching condition has been successfully demonstrated up to a VSWR of 10:1. The chip size is of 1.23 mm2 and the power consumption is below 10muA and 0.5 mA respectively in stand by mode and during switching, under 2.5 voltage supply
Keywords :
CMOS integrated circuits; antenna accessories; cellular radio; harmonic distortion; microwave antennas; microwave switches; monopole antennas; silicon-on-insulator; 0.13 micron; 0.5 mA; 0.55 to 0.8 dB; 1800 MHz; 1900 MHz; 2.5 V; 850 MHz; 900 MHz; CMOS SOI process; GSM standards; SP6T antenna switch; antenna mismatching condition; harmonics distortion; high resistivity substrate; multistandard handsets; power handling capability; single pole 6 throw antenna switch; Antenna measurements; CMOS process; Conductivity; Distortion measurement; GSM; Measurement standards; Power measurement; Semiconductor device measurement; Switches; Telephone sets;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2006. Digest of Papers. 2006 Topical Meeting on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-9472-0
Type :
conf
DOI :
10.1109/SMIC.2005.1587904
Filename :
1587904
Link To Document :
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