DocumentCode
3171638
Title
LEMMA-ADC: the linear error mechanism modelling algorithm applied to A/D-converters
Author
Carroll, Brian ; Wegener, Carsten ; Kennedy, Michael Peter
Author_Institution
Dept. of Electron. & Electr. Eng., Univ. Coll. Dublin, Ireland
fYear
1999
fDate
1999
Firstpage
145
Lastpage
148
Abstract
Shows that the LEMMA model development approach can be extended beyond DACs. For the chosen ADC, we have demonstrated that the LEMMA method can cut the test time for the (all codes testing) histogram method by reducing the required number of hits per code by a factor of two, without reducing the accuracy of the INLresult. We have also demonstrated LEMMA´s potential to save test time by using a short-codes test
Keywords
error analysis; A/D-converters; LEMMA-ADC; all codes testing; histogram method; linear error mechanism modelling algorithm; short-codes test; test time;
fLanguage
English
Publisher
iet
Conference_Titel
Advanced A/D and D/A Conversion Techniques and Their Applications, 1999. Third International Conference on (Conf. Publ. No. 466)
Conference_Location
Glasgow
ISSN
0537-9989
Print_ISBN
0-85296-718-7
Type
conf
DOI
10.1049/cp:19990483
Filename
794021
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