• DocumentCode
    317183
  • Title

    InGaAsP-InP ridge-waveguide DBR lasers with first-order surface gratings fabricated using CAIBE

  • Author

    Lammert, R.M. ; Jones, A.M. ; Youtsey, C.T. ; Hughes, J.S. ; Roh, S.D. ; Adesida, I. ; Coleman, J.J.

  • Author_Institution
    Microelectron. Lab., Illinois Univ., Urbana, IL, USA
  • Volume
    1
  • fYear
    1997
  • fDate
    10-13 Nov 1997
  • Firstpage
    278
  • Abstract
    Generally, the fabrication of distributed Bragg reflector (DBR) and distributed feedback (DFB) lasers requires regrowth over a grating. While fabricating these devices, special measures must be taken in order to preserve the grating during the regrowth. Moreover, surface preparation techniques are needed to remove grating fabrication contamination before regrowth. Utilizing surface gratings to fabricate DBR lasers solves the problem of regrowth. In this work, we employ chemically assisted ion beam etching (CAIBE) to form first-order DBR gratings into a 0.74 μm thick upper cladding structure for an InGaAsP-InP ridge-waveguide (RW) DBR QW laser with a first-order grating
  • Keywords
    III-V semiconductors; diffraction gratings; distributed Bragg reflector lasers; etching; gallium arsenide; gallium compounds; indium compounds; ion beam applications; optical fabrication; quantum well lasers; ridge waveguides; waveguide lasers; 0.74 mum; CAIBE; InGaAsP-InP; InGaAsP-InP ridge-waveguide DBR QW laser; InGaAsP-InP ridge-waveguide DBR lasers; chemically assisted ion beam etching; distributed Bragg reflector lasers; first-order DBR gratings; first-order surface gratings; grating fabrication contamination; regrowth; surface preparation techniques; upper cladding structure; Bragg gratings; Chemical lasers; Distributed Bragg reflectors; Distributed feedback devices; Ion beams; Laser feedback; Optical device fabrication; Pollution measurement; Surface contamination; Surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    1092-8081
  • Print_ISBN
    0-7803-3895-2
  • Type

    conf

  • DOI
    10.1109/LEOS.1997.630624
  • Filename
    630624