• DocumentCode
    3172039
  • Title

    Theoretical study of effect of position of dopant in a channel for nano scale devices

  • Author

    Lamba, V.K. ; Engles, Derick ; Malik, S.S.

  • Author_Institution
    Haryana Coll. of Technol., Haryana
  • fYear
    2007
  • fDate
    16-20 Dec. 2007
  • Firstpage
    247
  • Lastpage
    249
  • Abstract
    As the number of parameters such as carrier confinement, effects of parallel and transverse field- dependent mobility, carrier scattering due to Coulomb effects, acoustic phonons, impurity doping profile and surface roughness influences the transport process in the channel region. The simplest model of quantum transport in nano-devices is to describe the problem in terms of the scattering of the electron wave-function by a spatially varying potential. Here, we assume that this potential is situated between two electron reservoirs, each of which emits particles with an equilibrium distribution into the scattering region which is doped by impurity. As the reservoirs will, in general, have different chemical potentials, their difference representing an applied bias voltage. The net flux of electrons passing between the reservoirs constitutes the electrical current conducted by the device.
  • Keywords
    carrier mobility; chemical potential; impurity scattering; nanoelectronics; semiconductor doping; wave functions; channel mobility; chemical potentials; electron reservoirs; electron wave-function; impurity doping; nanoscale devices; quantum transport; spatially varying potential; Acoustic devices; Acoustic scattering; Carrier confinement; Doping profiles; Electrons; Impurities; Particle scattering; Phonons; Reservoirs; Scattering parameters; Carrier Scattering; Doping Profile; Mobility;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on
  • Conference_Location
    Mumbai
  • Print_ISBN
    978-1-4244-1728-5
  • Electronic_ISBN
    978-1-4244-1728-5
  • Type

    conf

  • DOI
    10.1109/IWPSD.2007.4472492
  • Filename
    4472492