• DocumentCode
    3172219
  • Title

    Dielectric, piezoelectric, and pyroelectric properties of Sr-doped PMT-PT solid solution ceramics

  • Author

    Jung, J.M. ; Park, Y.H. ; Choi, S.W.

  • Author_Institution
    Dept. of Phys., Dankook Univ., Chungnam, South Korea
  • fYear
    1991
  • fDate
    33457
  • Firstpage
    810
  • Lastpage
    811
  • Abstract
    Dielectric, piezoelectric and pyroelectric properties of 0.65(Pb 1-xSrx)(Mg1/3Ta2/3)O3 -0.35PbTiO3 (0⩽x⩽0.12) solid solution near the morphotropic phase boundary (PMT-PT) have been investigated. Dielectric constant and loss of poled ceramic samples were determined. The electromechanical coupling factor and piezoelectric d33 constant were measured for various compositions in the ceramics. The pyroelectric coefficient and spontaneous polarization were measured by the static Byer-Roundy method as a function of temperature. The values of dielectric constant, piezoelectric d33 constant and pyroelectric coefficient for Sr-doped PMT-PT are larger compared to the values observed for undoped PMT-PT ceramics. Transition temperature is continuously shifted to lower temperature with increase of a small amount of SrCO3
  • Keywords
    dielectric losses; dielectric polarisation; ferroelectric materials; ferroelectric transitions; lead compounds; permittivity; piezoceramics; pyroelectricity; strontium compounds; ((PbSr)(MgO3)(Ta2O3))0.65(PbTiO 3)0.35; 0.65(Pb1-xSrx)(Mg13/Ta23/)O 3-0.35PbTiO3; ceramics; dielectric; dielectric constant; dielectric loss; electromechanical coupling factor; morphotropic phase boundary; piezoelectric; piezoelectric d33 constant; pyroelectric; pyroelectric coefficient; spontaneous polarization; static Byer-Roundy method; transition temperature; Ceramics; Dielectric constant; Dielectric losses; Dielectric measurements; Grain size; Piezoelectric polarization; Pyroelectricity; Solids; Surface cracks; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
  • Conference_Location
    University Park, PA
  • Print_ISBN
    0-7803-1847-1
  • Type

    conf

  • DOI
    10.1109/ISAF.1994.522499
  • Filename
    522499