• DocumentCode
    3172721
  • Title

    Formation of Ge-based nanowires for nanoelectronic applications by vapor-liquid-solid mechanism

  • Author

    Das, K. ; Mondal, S.P. ; Dhar, A. ; Ray, S.K.

  • Author_Institution
    Indian Inst. of Technol. Kharagpur, Kharagpur
  • fYear
    2007
  • fDate
    16-20 Dec. 2007
  • Firstpage
    377
  • Lastpage
    379
  • Abstract
    Using vapour-liquid-solid mechanism, we have grown Ge and composition modulated Ge:SnO2 nanowires on gold coated silicon substrates with diameter distribution ranging from 30-100 nm, and length more than tens of micrometers. The outer sheath of pure Ge nanowires consists of GeO2 as revealed from the XRD and TEM analyses. Raman spectra of the as-grown nanowires exhibit a blue shift, which is attributed to the compressive strain in the wires. The formed T-junction Ge:SnO2 axial nanowire heterostructure is attractive for novel optical and electronic devices.
  • Keywords
    Raman spectra; X-ray diffraction; compressive strength; germanium; gold; nanoelectronics; nanowires; silicon; tin compounds; transmission electron microscopy; Raman spectra; SnO2:Ge; T-junction; TEM analysis; XRD; axial nanowire heterostructure; blue shift; compressive strain; germanium-based nanowires; gold coated silicon substrates; nanoelectronic applications; size 30 nm to 100 nm; vapor-liquid-solid mechanism; Capacitive sensors; Gold; Nanoparticles; Nanowires; Optical devices; Optical diffraction; Substrates; Temperature; X-ray diffraction; X-ray scattering; Ge-SnO2 nanowire; vapor-liquid-solid;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on
  • Conference_Location
    Mumbai
  • Print_ISBN
    978-1-4244-1728-5
  • Electronic_ISBN
    978-1-4244-1728-5
  • Type

    conf

  • DOI
    10.1109/IWPSD.2007.4472524
  • Filename
    4472524