Charge trapping levels in vacuum deposited poly (vinylidene fluoridechlorotrifluoroethylene) copolymer thin films

Author

Chand, S. ; Sharma, G.D. ; Dwivedi, S.

Author_Institution

Nat. Phys. Lab., New Delhi

fYear

2007

fDate

16-20 Dec. 2007

Firstpage

610

Lastpage

612

Abstract

Thermally stimulated discharge current (TSD) behaviour of vacuum deposited polyvinylidene fluoride-chlorotrifluoroethylene copolymer films (~ 10000 A) has been studied as a function of polarization field (1.0 x 10³ - 2.0 x 10⁴ V/cm). The TSD spectra of these films show a single relaxation peak whose charge and peak current vary non-linearly with the polarization field. The origin of the relaxation peak has been attributed to the migration of the charge carriers, injected from the electrodes, at the macroscopic distances and their subsequent trapping at energy levels lying ~ 0.48 eV.

Keywords

electron traps; polymer blends; polymer films; thermally stimulated currents; thin films; vacuum deposited coatings; charge carrier migration; charge trapping levels; copolymer thin films; poly(vinylidene fluoride-chlorotrifluoroethylene); thermally stimulated discharge current; vacuum deposition; Current measurement; Dielectric materials; Electrodes; Electron traps; Material storage; Organic light emitting diodes; Polarization; Polymer films; Sputtering; Temperature; Charge trapping; activation energy; copolymer; relaxation peak;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on

Conference_Location

Mumbai

Print_ISBN

978-1-4244-1728-5

Electronic_ISBN

978-1-4244-1728-5

Type

conf

DOI

10.1109/IWPSD.2007.4472591

Filename

4472591