DocumentCode :
3174290
Title :
High productivity thermocompression flip chip bonding
Author :
Clauberg, Horst ; Marte, Andreas ; Yanli Yang ; Eder, Jim ; Colosimo, Tom ; Buergi, Daniel ; Rezvani, Alireza ; Chylak, Bob
Author_Institution :
Kulicke & Soffa Industres, Inc., Fort Washington, PA, USA
fYear :
2015
fDate :
26-29 May 2015
Firstpage :
22
Lastpage :
29
Abstract :
Thermocompression (TC) bonding is seen as the next-generation packaging technology that will enable faster and more energy efficient devices in the face of slowing cost-performance gains achievable by advancing wafer fabrication technology. TC bonding will enable higher I/O counts and finer pitch interconnections than traditional interconnect methods through better control of the stress and warpage between devices and the substrate. In combination with through-silicon-vias (TSVs), TC bonding allows advanced memory stacks, such as the Hybrid Memory Cube and Wide-I/O memory.
Keywords :
flip-chip devices; integrated circuit interconnections; tape automated bonding; advanced memory stacks; advancing wafer fabrication technology; energy efficient devices; finer pitch interconnections; high productivity thermocompression flip chip bonding; hybrid memory cube; interconnect methods; next-generation packaging technology; through-silicon-vias; wide-I/O memory; Assembly; Bonding; Cooling; Films; Substrates; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location :
San Diego, CA
Type :
conf
DOI :
10.1109/ECTC.2015.7159566
Filename :
7159566
Link To Document :
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