Title :
Analysis of microwave integrated circuits using the finite element method
Author :
Polycarpou, A.C. ; Balanis, C.A.
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
Abstract :
A full-wave vector finite element method is implemented in this paper for modeling three-dimensional (3D) unshielded microwave circuits. A two-dimensional (2D) eigenvalue analysis is first applied at the input and output ports to evaluate the dominant field distribution, reference voltage, propagation constant, and characteristic impedance of the corresponding transmission line. The field distribution at the input port is used to excite the 3D circuit. The propagation constant is used in the implementation of first-order absorbing boundary conditions at the two ports, whereas the reference voltage and characteristic impedance are both used in the evaluation of the corresponding S-parameters.
Keywords :
S-parameters; eigenvalues and eigenfunctions; electric impedance; electrical engineering computing; electromagnetic field theory; electromagnetic fields; electromagnetic wave absorption; error correction; finite element analysis; low-pass filters; mesh generation; microwave filters; microwave integrated circuits; network analysis5822210; software packages; sparse matrices; transmission line theory; 3D circuit; S-parameters; characteristic impedance; field distribution; first-order absorbing boundary conditions; full-wave vector finite element method; input ports; microwave integrated circuits; output ports; propagation constant; reference voltage; three-dimensional unshielded microwave circuits; transmission line; two-dimensional eigenvalue analysis; Boundary conditions; Distributed parameter circuits; Eigenvalues and eigenfunctions; Finite element methods; Impedance; Microwave circuits; Microwave integrated circuits; Microwave theory and techniques; Propagation constant; Voltage;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1997. IEEE., 1997 Digest
Conference_Location :
Montreal, Quebec, Canada
Print_ISBN :
0-7803-4178-3
DOI :
10.1109/APS.1997.631549