• DocumentCode
    3174747
  • Title

    Rheology design considerations for one step chip attach materials (OSCA) used for conventional mass reflow processing

  • Author

    Duffy, Daniel J. ; Desai, Mahesh ; Bhavsar, Hemal ; Lin Xin ; Liu, Jean ; Tolla, Bruno

  • Author_Institution
    Kester Inc., Itasca, IL, USA
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    180
  • Lastpage
    186
  • Abstract
    One step chip attach (OSCA) materials are dispensable polymeric materials for flip chip assembly, which are designed to flux metallic interconnections and subsequently cure into an underfill providing mechanical reinforcement and environmental resistance following reflow. OSCA-R materials are designed specifically for conventional mass reflow processing and thus enable a drastic simplification of the assembly process by combining the fluxing, soldering, defluxing and capillary underfilling steps into a single step: the integration of this technology is transparent for the customer (e.g no capital investment needed) provided the product design integrates the customer´s production line specificities. As an example, OSCA-R materials must have a process-friendly rheological design that accommodates the various steps during device assembly. Simply stated, if OSCA-R materials cannot be dispensed properly or the die placed correctly the OSCA process will not work. This paper presents the rheological design of OSCA-R materials with a focus on the flow requirements during the dispensing and die placement process steps.
  • Keywords
    flip-chip devices; integrated circuit interconnections; microassembling; reflow soldering; rheology; OSCA materials; conventional mass reflow processing; customer production line specificity; die placement process; dispensable polymeric materials; environmental resistance following reflow; flip chip assembly; mechanical reinforcement; metallic interconnections; one step chip attach materials; rheology design; Assembly; Force; Loading; Rheology; Substrates; Temperature measurement; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159589
  • Filename
    7159589