DocumentCode :
3174807
Title :
Design and testing of high power, repetitively pulsed, solid-state closing switches
Author :
Boenig, Heinrich J. ; Schwartzenberg, John W. ; Willinger, Lawrence J. ; Piccone, Dante E. ; Lopez, Duane A. ; Smolleck, Howard A.
Author_Institution :
Los Alamos Nat. Lab., NM, USA
Volume :
2
fYear :
1997
fDate :
5-9 Oct 1997
Firstpage :
1022
Abstract :
Pulsed power physics experiments often require high-power, repetitively pulsed closing switches. Traditionally, ignitrons have been used in these applications when medium high voltage, high current switches are required. The availability of high power thyristors now provides the designer with the tool to install a switch based on solid-state technology. The solid-state switches show promise for low frequency, repetitively pulsed closing switches in medium voltage systems to a voltage rating of a few tens of kV and for currents to a few hundred kA. This paper presents a procedure for designing repetitively pulsed closing switches. Starting with the expected lifetime of the switch and taking the cyclic stress loading into account, all other critical design parameters are evaluated when designing a solid-state device to its full capability without overstressing the device. Based on the procedure, the preliminary design of a 12.5 kV, 80 kA, 3 ms, 2 Hz switch is presented. Experimental results for a 73 kA, 7 ms, 11 kV, air-cooled switch are given. The paper concludes with comments about the pulsed power capability of 125 mm thyristors. Test results of a 180 kA/800 μs current pulse with a di/dt value of 1200 A/μs are included
Keywords :
cooling; pulsed power switches; testing; thyristor applications; 11 kV; 12.5 kV; 125 mm; 180 kA; 2 Hz; 3 ms; 7 ms; 73 kA; 80 kA; 800 mus; air-cooled switch; cyclic stress loading; expected switch lifetime; high current switches; high power switches; high power thyristors; low frequency; medium high voltage; pulsed power capability; pulsed power physics experiments; repetitively pulsed switches; solid-state closing switches; Capacitors; Laboratories; Magnetic circuits; Magnetic fields; Physics; Solid state circuits; Switches; Testing; Thyristors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1997. Thirty-Second IAS Annual Meeting, IAS '97., Conference Record of the 1997 IEEE
Conference_Location :
New Orleans, LA
ISSN :
0197-2618
Print_ISBN :
0-7803-4067-1
Type :
conf
DOI :
10.1109/IAS.1997.628986
Filename :
628986
Link To Document :
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