• DocumentCode
    3174827
  • Title

    Novel mass reflow method for organic substrates

  • Author

    Khanna, Vijay D. ; Sri-Jayantha, Sri M.

  • Author_Institution
    T.J. Watson Res. Center, IBM Res., Yorktown Heights, NY, USA
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    200
  • Lastpage
    207
  • Abstract
    The warp of an organic substrate is a major challenge for bond and assembly (B&A) operations. A portable vacuum fixture that eliminates the warp by holding the substrate perfectly flat during the chip attach process is introduced in this paper. Excellent C4 height uniformity with increased B&A yield is achieved by this novel method. The fixture also makes it possible to utilize all electrically good substrates irrespective of their incoming shape. Furthermore, the electrical performance of the substrate is no longer constrained by the need to modify its circuit design to reduce the warp. The vacuum fixture is designed to be compatible with an industry standard mass reflow oven. The design of the fixture is described along with the manufacturing challenges that were faced. A transient thermal model, leveraged to optimize the thermal mass of the fixture by a factor of two, is presented. The performance of the fixture is compared to other mechanical techniques used for clamping substrates flat. The fixture´s unique ability to shape the substrate to match the warp of the chip at reflow temperatures is discussed. Finally, application of the technique to challenging chip-attach cases is explored.
  • Keywords
    chip scale packaging; flip-chip devices; substrates; bond and assembly operations; chip attach process; industry standard mass reflow oven; mass reflow method; organic substrates; portable vacuum fixture; reflow temperatures; transient thermal model; Fixtures; Heating; Ovens; Prototypes; Seals; Substrates; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159592
  • Filename
    7159592