DocumentCode
3174904
Title
De-embedding of reverse recovery losses in fast switching VRM applications
Author
Tolle, Tobias ; Duerbaum, Thomas ; Elferich, Reinhold
Author_Institution
Philips Res. Lab., Aachen, Germany
Volume
2
fYear
2003
fDate
9-13 Feb. 2003
Firstpage
958
Abstract
For the synchronous buck converter used in VRM applications, one major contributor to switching losses is reverse recovery. These losses however cannot directly be measured because capacitive current and several other phenomena superimpose the mere reverse recovery. The paper describes how calculate the capacitive part of the drain current and how to de-embed the channel current out of the total drain current. This can show the size of Q/sub rr/ and reveal effects such as gate bouncing and avalanche breakdown.
Keywords
DC-DC power convertors; MOSFET; avalanche breakdown; bridge circuits; rectification; MOSFET characterisation; VRM applications; avalanche breakdown; capacitive current; de-embedding; drain current; fast switching; gate bouncing; half-bridge; reverse recovery losses; switching losses; synchronous buck converter; synchronous rectification; Avalanche breakdown; Buck converters; Current measurement; FETs; Frequency; Inductors; Laboratories; MOSFET circuits; Switches; Switching loss;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition, 2003. APEC '03. Eighteenth Annual IEEE
Conference_Location
Miami Beach, FL, USA
Print_ISBN
0-7803-7768-0
Type
conf
DOI
10.1109/APEC.2003.1179332
Filename
1179332
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