DocumentCode :
3174904
Title :
De-embedding of reverse recovery losses in fast switching VRM applications
Author :
Tolle, Tobias ; Duerbaum, Thomas ; Elferich, Reinhold
Author_Institution :
Philips Res. Lab., Aachen, Germany
Volume :
2
fYear :
2003
fDate :
9-13 Feb. 2003
Firstpage :
958
Abstract :
For the synchronous buck converter used in VRM applications, one major contributor to switching losses is reverse recovery. These losses however cannot directly be measured because capacitive current and several other phenomena superimpose the mere reverse recovery. The paper describes how calculate the capacitive part of the drain current and how to de-embed the channel current out of the total drain current. This can show the size of Q/sub rr/ and reveal effects such as gate bouncing and avalanche breakdown.
Keywords :
DC-DC power convertors; MOSFET; avalanche breakdown; bridge circuits; rectification; MOSFET characterisation; VRM applications; avalanche breakdown; capacitive current; de-embedding; drain current; fast switching; gate bouncing; half-bridge; reverse recovery losses; switching losses; synchronous buck converter; synchronous rectification; Avalanche breakdown; Buck converters; Current measurement; FETs; Frequency; Inductors; Laboratories; MOSFET circuits; Switches; Switching loss;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2003. APEC '03. Eighteenth Annual IEEE
Conference_Location :
Miami Beach, FL, USA
Print_ISBN :
0-7803-7768-0
Type :
conf
DOI :
10.1109/APEC.2003.1179332
Filename :
1179332
Link To Document :
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