DocumentCode
3175008
Title
Through Silicon Capacitors (TSC) for noise reduction in Power Distribution Network
Author
Dieng, Khadim ; Artillan, Philippe ; Bermond, Cedric ; Guiller, Olivier ; Lacrevaz, Thierry ; Joblot, Sylvain ; Houzet, Gregory ; Farcy, Alexis ; Lamy, Yann ; Flechet, Bernard
Author_Institution
IMEP-LAHC, Univ. Savoie Mont Blanc, Le Bourget du Lac, France
fYear
2015
fDate
26-29 May 2015
Firstpage
247
Lastpage
253
Abstract
Inspired from Through Silicon Vias (TSVs), Through Silicon Capacitors (TSCs) are newly developed and integrated throughout silicon interposers. Thanks to the use of the third dimension in the silicon interposer, TSC technology allows to obtain high capacitance density, up to 56 nF/mm2. This paper deals with a demonstrator to investigate the impact of large matrices of TSCs (13×13 TSCs) on the electrical performance of Power Distribution Networks (PDN). First, the frequency response of TSCs matrix is modeled from DC to 10 GHz. Next, extracted spice models are used to simulate the PDN impedance of a typical processor circuit. Finally a transient analysis is performed to evaluate the performance of the PDN in the time domain. TSCs allow to reduce considerably voltage ripples on the PDN and one obtained less than 10% of voltage ripples for a total capacitance of 1.4 μF.
Keywords
capacitance; capacitors; electric impedance; integrated circuit interconnections; integrated circuit noise; matrix algebra; silicon; three-dimensional integrated circuits; time-domain analysis; transient analysis; PDN impedance; Spice model; TSC matrix; TSC technology; TSV; capacitance density; noise reduction; power distribution network; silicon interposer; through silicon capacitor; through silicon via; time domain; transient analysis; voltage ripple; Capacitance; Capacitors; Impedance; Microprocessors; Silicon; Through-silicon vias; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location
San Diego, CA
Type
conf
DOI
10.1109/ECTC.2015.7159600
Filename
7159600
Link To Document