• DocumentCode
    3175008
  • Title

    Through Silicon Capacitors (TSC) for noise reduction in Power Distribution Network

  • Author

    Dieng, Khadim ; Artillan, Philippe ; Bermond, Cedric ; Guiller, Olivier ; Lacrevaz, Thierry ; Joblot, Sylvain ; Houzet, Gregory ; Farcy, Alexis ; Lamy, Yann ; Flechet, Bernard

  • Author_Institution
    IMEP-LAHC, Univ. Savoie Mont Blanc, Le Bourget du Lac, France
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    247
  • Lastpage
    253
  • Abstract
    Inspired from Through Silicon Vias (TSVs), Through Silicon Capacitors (TSCs) are newly developed and integrated throughout silicon interposers. Thanks to the use of the third dimension in the silicon interposer, TSC technology allows to obtain high capacitance density, up to 56 nF/mm2. This paper deals with a demonstrator to investigate the impact of large matrices of TSCs (13×13 TSCs) on the electrical performance of Power Distribution Networks (PDN). First, the frequency response of TSCs matrix is modeled from DC to 10 GHz. Next, extracted spice models are used to simulate the PDN impedance of a typical processor circuit. Finally a transient analysis is performed to evaluate the performance of the PDN in the time domain. TSCs allow to reduce considerably voltage ripples on the PDN and one obtained less than 10% of voltage ripples for a total capacitance of 1.4 μF.
  • Keywords
    capacitance; capacitors; electric impedance; integrated circuit interconnections; integrated circuit noise; matrix algebra; silicon; three-dimensional integrated circuits; time-domain analysis; transient analysis; PDN impedance; Spice model; TSC matrix; TSC technology; TSV; capacitance density; noise reduction; power distribution network; silicon interposer; through silicon capacitor; through silicon via; time domain; transient analysis; voltage ripple; Capacitance; Capacitors; Impedance; Microprocessors; Silicon; Through-silicon vias; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159600
  • Filename
    7159600