Title :
Inductance characterization of high-leakage transformers
Author :
Hayes, John G. ; Donovan, Neil O. ; Egan, Michael G. ; Donnell, Terence O.
Author_Institution :
Electr. & Electron. Eng., Univ. Coll. Cork, Ireland
Abstract :
In this paper the inductances of high-leakage transformers are investigated by analysis, measurement, and finite-element simulation. Series-coupling tests, featuring differential coupling (series opposing) and cumulative coupling (series aiding), are conducted in addition to the standard open-circuit and short-circuit tests. This paper initially reviews and discusses the various test approach featuring the open-circuit, short-circuit and series-coupling tests. Two very different types of high-leakage transformers are then characterized based on these tests. The short-circuit and series-coupling tests performed comparably for investigating the spatial variations of the primary and secondary leakage inductances of the high-power, high-leakage transformer first investigated. For the second low-power, high-leakage, high-resistance planar transformer the differential-coupling test proves to be a more useful, accurate, and insightful test than the short-circuit test.
Keywords :
finite element analysis; inductance measurement; magnetic leakage; power transformer testing; short-circuit currents; cumulative coupling; differential coupling; finite-element simulation; high-power high-leakage transformer; inductance measurement; low-power high-resistance planar transformer; open-circuit test; primary leakage inductance; secondary leakage inductance; series aiding; series opposing; series-coupling test; short-circuit test; spatial variation; Analytical models; Circuit testing; Electrical resistance measurement; Finite element methods; Geometry; Impedance; Inductance measurement; Magnetic analysis; Predictive models; Transformers;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2003. APEC '03. Eighteenth Annual IEEE
Conference_Location :
Miami Beach, FL, USA
Print_ISBN :
0-7803-7768-0
DOI :
10.1109/APEC.2003.1179361