• DocumentCode
    3175385
  • Title

    Dominant resonant mode damping of a piezoelectric tube nanopositioner using optimal sensorless shunts

  • Author

    Aphale, Sumeet S. ; Moheimani, S. O Reza ; Fleming, Andrew J.

  • Author_Institution
    Univ. of Newcastle, Newcastle
  • fYear
    2007
  • fDate
    9-13 July 2007
  • Firstpage
    2220
  • Lastpage
    2225
  • Abstract
    Piezoelectric tube scanners are used in most commercial scanning probe microscopes, to provide precise motion to the scanning tip. Due to their mechanical construction, they have a relatively low-frequency first resonant mode. This mode gets excited due to environmental noise and introduces errors in the scan obtained. In precision scanning applications, this limits the upper bound of a triangular scan rate to around 1/100th the first mechanical resonance frequency. Feedback control techniques and shunt damping methods have shown promising results in damping this resonant mode and improving scan performance. Most of these techniques need a sensor, which in turn adds complexity to the overall system. With this motivation, passive sensorless shunt damping has been investigated and documented. In this work, we design active sensorless shunts, optimized using H2 and Hinfin techniques. These shunts damp the modal amplitude of the first resonant peak by almost 24 dB. A triangle raster pattern used to test the scan accuracy shows significant improvement due to the damping achieved by these active shunts.
  • Keywords
    Hinfin control; damping; feedback; instrumentation; nanopositioning; piezoelectric devices; Feedback control techniques; H2 techniques; Hinfin techniques; dominant resonant mode damping; mechanical resonance frequency; optimal sensorless shunts; passive sensorless; piezoelectric tube nanopositioner; scanning probe microscopes; triangle raster pattern; Damping; Feedback control; Mechanical sensors; Microscopy; Nanopositioning; Probes; Resonance; Resonant frequency; Upper bound; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2007. ACC '07
  • Conference_Location
    New York, NY
  • ISSN
    0743-1619
  • Print_ISBN
    1-4244-0988-8
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2007.4283080
  • Filename
    4283080