DocumentCode
3175441
Title
Nanostructuring in semiconductors by swift heavy ions
Author
Sinha, O.P. ; Srivastava, P.C. ; Ganesan, V.
Author_Institution
Banaras Hindu Univ., Varanasi
fYear
2007
fDate
16-20 Dec. 2007
Firstpage
921
Lastpage
921
Abstract
There have been enormous worldwide research efforts in semiconductor nanostructures in the last decade. The basic motivation behind the study of semiconductor nanostructures is that the quantum-confinement effect in such low dimensional systems allows devices with promising properties to be engineered. Ion irradiation is a promising tool for nano-patterning of semiconductor surface because of its compatibility and reproducibility with easily controllable growth conditions. Semiconductor Surfaces(Si and GaAs) have been exposed to 100MeV Si and Au ions in the fluence range of 1010 ions cm-2 to 1013 ions cm-2. Surface morphological studies has been carried out using Atomic Force Microscopy. The formation of nano hillocks and nano dots having the dimension in few nanometer range have been observed on the irradiated surfaces. The observed features will be discussed in the realm of ion-matter interaction in MeV regime, lateral mass transport and contribution of plastic flow phenomena.
Keywords
III-V semiconductors; atomic force microscopy; elemental semiconductors; gallium arsenide; gallium compounds; gold; heavy ion-nucleus reactions; nanopatterning; nanostructured materials; silicon; surface morphology; Au; GaAs; Si; atomic force microscopy; ion irradiation; ion matter interaction; low dimensional systems; mass transport; nanodots; nanohillocks; nanopatterning; plastic flow; quantum confinement; semiconductor nanostructures; semiconductor surface; surface morphology; swift heavy ions; Atomic force microscopy; Atomic measurements; Gallium arsenide; Gold; Nanotechnology; Plastics; Reproducibility of results; Semiconductor nanostructures; Surface morphology;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on
Conference_Location
Mumbai
Print_ISBN
978-1-4244-1728-5
Electronic_ISBN
978-1-4244-1728-5
Type
conf
DOI
10.1109/IWPSD.2007.4472674
Filename
4472674
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