Generalized Partial Test Case Generation Method

Finite State Machines (FSMs) are widely used to generate test case suites for critical systems. Several test case generation methods are derived from the well-known W-method. The Wp-method is a variation of the W-method, which produces smaller test suites. The G-method is a generalization of the W-method, which dispenses the use of characterization sets. In this paper, we combine ideas of both, and introduce a new generalized method, that does not depend on characterization sets, as the Wp-method does, and may produce smaller test suites than those of the G-method.