Title :
ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153)
Abstract :
The following topics were dealt with: matching; parameter extraction; device characterization; RF technology; process charaterization; interconnects; reliability
Keywords :
integrated circuit testing; microelectronic test structures;
Conference_Titel :
Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on
Conference_Location :
Kobe, Japan
Print_ISBN :
0-7803-6511-9
DOI :
10.1109/ICMTS.2001.928626
