Statistical modeling techniques: FPV vs. BPV

Author

Telang, N. ; Higman, J.M.

Author_Institution

Semicond. Products Sector, Motorola Inc., Austin, TX, USA

fYear

2001

fDate

2001

Firstpage

71

Lastpage

75

Abstract

A comparison of forward and backward propagation of variance methods is presented, applied to generation of SPICE models that capture the statistical variation of microelectronic devices. MOSFET examples taken directly from a CMOS process are used to highlight the challenges in accurately capturing statistical process variation during process development. Ring oscillator simulations are used to quantify the performance of worst and best case models generated by each method

Keywords

MOSFET; SPICE; semiconductor device models; statistical analysis; BPV statistical modeling techniques; CMOS process; FPV statistical modeling; MOSFET; SPICE model generation; backward propagation of variance method; best case models; forward propagation of variance method; microelectronic devices; process development; ring oscillator simulations; statistical modeling techniques; statistical process variation; statistical variation; worst case models; CMOS process; Data mining; Electronic mail; Histograms; MOSFET circuits; Microelectronics; Postal services; Ring oscillators; SPICE; Semiconductor device modeling;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on

Conference_Location

Kobe

Print_ISBN

0-7803-6511-9

Type

conf

DOI

10.1109/ICMTS.2001.928640

Filename

928640