DocumentCode :
3176723
Title :
A novel wafer dicing method using metal-assisted chemical etching
Author :
Asano, Yusaku ; Matsuo, Keiichiro ; Ito, Hisashi ; Higuchi, Kazuhito ; Shimokawa, Kazuo ; Sato, Tsuyoshi
Author_Institution :
Corp. Manuf. Eng. Center, Toshiba Corp., Yokohama, Japan
fYear :
2015
fDate :
26-29 May 2015
Firstpage :
853
Lastpage :
858
Abstract :
A novel wafer dicing method that can singulate silicon wafers into individual dies at once has been developed. Since this method relies on chemical reactions, we call it Chemical Dicing. Chemical Dicing has the advantages of high throughput, narrow dicing line width, and high chip strength compared to conventional blade dicing methods. Chemical Dicing is based on the catalytic wet etching technique called metal-assisted chemical etching (MacEtch). However, the appropriate conditions required to form deep vertical trenches for Chemical Dicing with MacEtch remain controversial. In this paper, the MacEtch mechanisms and appropriate conditions for Chemical Dicing have been verified. The results show that the shape of the trenches can be controlled by a catalyst and a etchant composition, and Chemical Dicing can create vertical trenches with a depth greater than 150 μm and width less than 8 μm. The results are expected to contribute to the development of future dicing techniques.
Keywords :
catalysts; etching; semiconductor technology; catalytic wet etching technique; chemical dicing; deep vertical trenches; high chip strength; metal-assisted chemical etching; narrow dicing line width; silicon wafers; wafer dicing method; Atomic layer deposition; Chemicals; Etching; Gold; Hafnium; Semiconductor device modeling; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location :
San Diego, CA
Type :
conf
DOI :
10.1109/ECTC.2015.7159692
Filename :
7159692
Link To Document :
بازگشت