Accurate analysis of substrate sensitivity of active transistors in an analog circuit

A substrate network tailored for a variety of transistor geometry including channel sizes, fingering and folding, and shapes and placements of guard bands, extends the capability and accuracy of full-chip noise coupling analysis of mixed technology VLSI integration. Analysis of substrate sensitivity of differential amplifiers in a 90 nm CMOS technology with more than 64 different geometry and operating conditions well agrees with on-chip substrate coupling measurements, with the discrepancy within 3 dB.