• DocumentCode
    3177400
  • Title

    A 12.4μm2 133.4μW 4.56mV/°C resolution digital on-chip thermal sensing circuit in 45nm CMOS utilizing sub-threshold operation

  • Author

    Datta, Basab ; Burleson, Wayne

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Massachusetts, Amherst, MA, USA
  • fYear
    2011
  • fDate
    14-16 March 2011
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Dynamic thermal management (DTM) schemes rely on physical sensors to provide them with feedback to ensure an accurate and closed-loop throttling mechanism. Power-density trends in current-generation, high-performance processors motivate the need for multiple low-area, low-power and high-sensitivity temperature monitoring circuits. To this end, we have proposed and implemented in 45nm CMOS, a novel, digital, on-chip thermal sensing circuit with a high thermal sensitivity of 4.56mV/°C, low power dissipation of 133.4μW and a compact layout occupying 12.4μ2. The design is robust towards process and supply induced noise incurring a 1-σ accuracy loss of <;=1.24°C for a +/-10% random variation in the physical and environmental parameters.
  • Keywords
    CMOS integrated circuits; circuit feedback; circuit layout; integrated circuit noise; microprocessor chips; temperature sensors; thermal management (packaging); CMOS; DTM scheme; closed-loop throttling; compact layout; current generation; digital on-chip thermal sensing circuit; dynamic thermal management; feedback; high-performance processor; high-sensitivity temperature monitoring circuit; induced noise; physical sensor; power 133.4 muW; power dissipation; power-density trend; size 45 nm; subthreshold operation; thermal sensitivity; Accuracy; Sensitivity; System-on-a-chip; Temperature measurement; Temperature sensors; Thermal sensor; high-resolution; low-power; sub-threshold;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2011 12th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-61284-913-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2011.5770705
  • Filename
    5770705