• DocumentCode
    3177460
  • Title

    Integrated module structure of fan-out wafer level package for terahertz antenna

  • Author

    Ishibashi, Daijiro ; Sasaki, Shinya ; Ishizuki, Yoshikatsu ; Iijima, Shinya ; Nakata, Yoshihiro ; Kawano, Yoichi ; Suzuki, Toshihide ; Tani, Motoaki

  • Author_Institution
    Fujitsu Labs. Ltd., Atsugi, Japan
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    1084
  • Lastpage
    1089
  • Abstract
    We propose a novel integrated antenna module based on fan-out wafer level package (FO-WLP) for terahertz applications. A patch structure is employed for an antenna since it is suited for low height module. Both an insulator made of polyphenylene ether (PPE) and a reflector made of copper block, together with a chip for high frequency operation, were embedded into a mold used for FO-WLP. A driven element of the antenna and an interconnection between the antenna and the chip were formed by redistribution layer (RDL) technology. The height of the insulator was set to 40 um in order to maximize the radiation efficiency of 300-GHz radio wave. We developed the module and evaluated the performances. Measured frequency characteristics were well matched to analytical result. The measured loss of reflection characteristics of developed module was 3 dB. Therefore, the module achieved 1.5-dB insertion loss even at terahertz frequency. These results exhibit proposing structure is effective as a terahertz module.
  • Keywords
    copper; microstrip antennas; polymer insulators; submillimetre wave antennas; wafer level packaging; Cu; copper block reflector; fan-out wafer level package; frequency 300 GHz; integrated antenna module; integrated module structure; loss 1.5 dB; patch structure; polyphenylene ether insulator; redistribution layer technology; terahertz antenna; Antenna measurements; Insulators; Loss measurement; Patch antennas; Resonant frequency; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159729
  • Filename
    7159729