Compact circuit modeling of RF characteristics of 1-D nanostructures

Summary form only given. A method to extract compact circuit models for one-dimensional nanostructures from measured high-frequency characteristics is described. We demonstrate that a frequency-independent parallel RC circuit is the simplest model that accurately describes high-frequency electrical conduction in carbon nanofibers. The resistance is determined from dc measurement and the capacitance is extracted directly from measured S-parameters for a ground-signal-ground test structure, without using any fitting parameter. The results obtained from the circuit model for carbon nanofibers are within ±0.5 dB and ±5° of measured S-parameters up to 50 GHz. The model is further justified by examining the relationship between S and Y-parameters of the test network.