DocumentCode
3177686
Title
Multi-objective optimization techniques for VLSI circuits
Author
Kashfi, Fatemeh ; Hatami, Safar ; Pedram, Massoud
Author_Institution
Univ. of Southern California, Los Angeles, CA, USA
fYear
2011
fDate
14-16 March 2011
Firstpage
1
Lastpage
8
Abstract
The EDA design flows must be retooled to cope with the rapid increase in the number of operational modes and process corners for a VLSI circuit, which in turn results in different and sometimes conflicting design goals and requirements. Single-objective solutions to various design optimization problems, ranging from sizing and fanout optimization to technology mapping and cell placement, must hence be augmented to deal with this changing landscape. This paper starts off by presenting a variety of methods for providing analytical models for power and delay to be used in the optimization algorithms. The modeling includes non-convex and convex functional forms. Next, a class of robust and scalable methods for solving multi-objective optimization problems (MOP) in a digital circuit is presented. We present the results of a multi-objective (i.e., power dissipation and delay) gate (transistor) sizing optimization algorithm to demonstrate the effectiveness of our method. We set up the problem as a simultaneous, multi-objective optimization problem and solve it by using the Weighted Sum and Compromise Programming methods. After comparing these two methods, we present the Satisficing Trade-off Method (STOM) to find the most desirable operating point of a circuit.
Keywords
VLSI; optimisation; EDA design flows; MOP; STOM; VLSI circuits; analytical models; compromise programming methods; digital circuit; multiobjective gate sizing optimization algorithm; nonconvex functional forms; optimization problems; satisficing trade-off method; weighted sum methods; Analytical models; Delay; Equations; Integrated circuit modeling; Mathematical model; Optimization; Power dissipation; Convexity; Delay; Multi-objective optimization; Pareto surface; Power; STOM;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2011 12th International Symposium on
Conference_Location
Santa Clara, CA
ISSN
1948-3287
Print_ISBN
978-1-61284-913-3
Type
conf
DOI
10.1109/ISQED.2011.5770720
Filename
5770720
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