• DocumentCode
    3177731
  • Title

    Dual-side cooling for a three-dimensional (3D) chip stack : Additional cooling from the laminate (substrate) side

  • Author

    Matsumoto, Keiji ; Mori, Hiroyuki ; Orii, Yasumitsu

  • Author_Institution
    NANOBIC, IBM Res. - Tokyo, Kawasaki, Japan
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    1176
  • Lastpage
    1182
  • Abstract
    The thermal resistance of a three-dimensional (3D) chip stack has been experimentally clarified by authors [1-6] and an additional cooling solution is strongly required to achieve various structures of 3D chip stacks. Especially, when a high heat dissipating chip is located as a bottom chip, cooling from the bottom side of chips (in other words, from the laminate (substrate) side) is identified to be very effective by authors [7]. For cooling from the bottom side of a laminate, reduction of the thermal resistance of a laminate is important, and the effect of high thermal conductivity insulator (dielectric) is simulated as a function of the thermal via density, and via-hole-fabrication capability in various maker´s high thermal conductivity insulator is also discussed. Secondly, placing a graphite sheet in the joint (interconnection) layer between a bottom chip and a laminate is proposed. When a graphite sheet is directly connected to a lid (heat spreader), it is examined how much additional heat density is managed by this cooling structure. As another aspect, in order to effectively conduct the hot spot heat of a bottom chip to large area of a laminate and accommodate various thermal via locations, it is simulated how effectively the hot spot heat of a bottom chip is spread by placing a graphite sheet in the joint layer between a bottom chip and a laminate. For cooling from the bottom side of chips, it is essential to consider the trade-off among thermal, electrical and mechanical performance and it is also discussed.
  • Keywords
    cooling; graphite; integrated circuit interconnections; thermal conductivity; thermal management (packaging); thermal resistance; three-dimensional integrated circuits; 3D chip stack; bottom chip; dual-side cooling; heat dissipating chip; laminate side; substrate side; thermal conductivity insulator; thermal resistance; thermal via density; via-hole-fabrication; Conductivity; Cooling; Graphite; Joints; Laminates; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159744
  • Filename
    7159744