DocumentCode :
3177834
Title :
A low overhead fault tolerant routing scheme for 3D Networks-on-Chip
Author :
Pasricha, Sudeep ; Zou, Yong
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA
fYear :
2011
fDate :
14-16 March 2011
Firstpage :
1
Lastpage :
8
Abstract :
Three-dimensional integrated circuits (3D-ICs) offer a significant opportunity to enhance the performance of emerging chip multiprocessors (CMPs) using high density stacked device integration and shorter through silicon via (TSV) interconnects that can alleviate some of the problems associated with interconnect scaling in s ub-65nm CMOS technologies. However, network-on-chip (NoC) fabrics that will connect the cores together in 3D-ICs will increasingly be susceptible to permanent and intermittent faults, which can cause catastrophic system failure. To overcome these faults, NoC routing schemes can be enhanced by adding fault tolerance capabilities, so that they can adapt communication flows to follow fault-free paths. Existing work has proposed various fault tolerant routing algorithms for 2D NoCs. In this paper, for the first time, we investigate fault tolerant routing schemes in 3D NoCs. To achieve high arrival rates in the presence of faults, we propose a novel low-overhead fault tolerant routing scheme (4NP-First) for 3D NoCs. The proposed scheme is shown to have better resilience and adaptivity to f aults compared to e xisting dimension-order, turn-model, and stochastic random walk based 2D NoC routing schemes extended to 3D NoCs.
Keywords :
CMOS integrated circuits; fault diagnosis; fault tolerance; integrated circuit interconnections; integrated circuit testing; multiprocessing systems; network routing; network-on-chip; three-dimensional integrated circuits; 3D networks-on-chip; 3D-IC; CMOS technology; NoC fabrics; NoC routing; TSV interconnects; catastrophic system failure; chip multiprocessor; communication flow; fault tolerance; fault-free path; high density stacked device integration; interconnect scaling; low-overhead fault tolerant routing scheme; network-on-chip; size 65 nm; three-dimensional integrated circuit; through silicon via; 3D integrated circuits; Fault tolerant routing; networks on chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2011 12th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-61284-913-3
Type :
conf
DOI :
10.1109/ISQED.2011.5770726
Filename :
5770726
Link To Document :
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