• DocumentCode
    3178076
  • Title

    Debugging and optimizing high performance superscalar out-of-order processors using formal verification techniques

  • Author

    Alizadeh, Bijan ; Fujita, Masahiro

  • Author_Institution
    Electr. & Comput. Eng. Dept. (ECE), Univ. of Tehran, Tehran, Iran
  • fYear
    2011
  • fDate
    14-16 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper proposes a multiplexer based method, which has been used for RTL/gate level debugging, into cycle accurate design of high performance microprocessors so that complicated superscalar out-of-order processors with performance optimization techniques can be formally debugged and optimized. The results show that our debugging method reduces the complexity of the counterexamples so that verification engineers can quickly locate the bugs. In addition, our optimization technique not only improves the performance of the target processor by avoiding unnecessary stalls and replays, but also reduces the complexity of the verification process by reducing the size of the formulas to be checked by SAT/SMT solvers despite the fact that the number of simulation cycles increases. The results show that the size of the propositional formulas for verification is reduced by up to an order of magnitude and also their verification time by up to two orders of magnitude has been reduced.
  • Keywords
    formal verification; microprocessor chips; program debugging; cycle accurate design; formal verification techniques; gate level debugging; microprocessor; multiplexer based method; simulation cycle; superscalar out-of-order processor; target processor; verification process; verification time; Computer bugs; Debugging; Optimization; Out of order; Registers; Timing; Debugging; Formal Verification; OOO processor; Optimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2011 12th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-61284-913-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2011.5770740
  • Filename
    5770740