Title :
Silicon photonics packaging for highly scalable optical interconnects
Author :
La Porta, A. ; Weiss, J. ; Dangel, R. ; Jubin, D. ; Meier, N. ; Hofrichter, J. ; Caer, C. ; Horst, F. ; Offrein, B.J.
Author_Institution :
IBM Res. - Zurich, Zurich, Switzerland
Abstract :
Big Data and cloud-based applications drive the increasing amount of data traffic between and within data centers. Optical interconnect technology offers a larger bandwidth-distance product, interconnect density and power efficiency as copper based links. Integrated silicon photonics provides a tight integration between the optical functions with electronics on a single silicon die at the competitive cost-level of CMOS technology. All necessary silicon photonic building blocks operating at 1.3 μm and 1.55 μm have already been demonstrated. However, one of the remaining challenges is the system-level assembly, including a scalable connectorization scheme for very high optical I/O counts. To overcome this limitation, we demonstrate in this paper a silicon photonic packaging solution using polymer waveguides, which can be routed tightly to the silicon chip edge. As a first step towards this implementation, the optical coupling between a silicon photonics chip and the polymer waveguides is here discussed. The experimental results of the coupling loss and tolerance to misalignments between a silicon waveguide and a single-mode polymer waveguide processed on the chip are reported.
Keywords :
CMOS integrated circuits; elemental semiconductors; integrated optics; monolithic integrated circuits; optical interconnections; silicon; CMOS technology; data centers; data traffic; integrated silicon photonics; interconnect density; optical I/O counts; optical interconnects; polymer waveguides; scalable connectorization scheme; silicon photonic building blocks; silicon photonics packaging; silicon waveguide; size 1.3 mum; size 1.55 mum; system-level assembly; Optical coupling; Optical fibers; Optical polymers; Silicon;
Conference_Titel :
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location :
San Diego, CA
DOI :
10.1109/ECTC.2015.7159765