DocumentCode :
317819
Title :
Pattern recognition and quality control: an intelligent approach to identify defects
Author :
Paladini, Edson Pacheco
Author_Institution :
Dept. de Engenharia de Producao e Sistemas, Univ. Fed. de Santa Catarina, Florianapolis, Brazil
Volume :
5
fYear :
1997
fDate :
12-15 Oct 1997
Firstpage :
4063
Abstract :
This paper describes a knowledge-based system utilized to identify imperfections or defects in industrial products. The kind of defects we study appear on the piece external area (like spots, fractures, scratches, dark or white lines). The application of the system has been developed in wall or floor tile factories and has proved to be adequate. The system works with codified information from the wall or floor tile faces. This information is accessed by special devices which pick up the image and transform it in an array of numbers and codes. Therefore, the system behavior can be defined by this information. Initially the system detects the existence of imperfections using a first group of computational programs; after that, a second group of programs defines the gravity level of each detected defect (for instance, if it implies to reject the piece). Finally, a third group of programs (the identification system) informs its users of the type of imperfection detected, i.e. promotes its identification. We show the general idea of the identification system and some results. This can be seen as a useful and interesting application of knowledge-based systems in the quality control area
Keywords :
automatic optical inspection; computer vision; knowledge based systems; pattern recognition; production engineering computing; quality control; codified information; computational programs; computer vision; defect detection; identification system; imperfection detection; industrial products; intelligent approach; knowledge-based system; pattern recognition; quality control; system behavior; tile factories; Face detection; Gravity; Intelligent control; Knowledge based systems; Pattern recognition; Production facilities; Production systems; Proposals; Quality control; Tiles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Man, and Cybernetics, 1997. Computational Cybernetics and Simulation., 1997 IEEE International Conference on
Conference_Location :
Orlando, FL
ISSN :
1062-922X
Print_ISBN :
0-7803-4053-1
Type :
conf
DOI :
10.1109/ICSMC.1997.637332
Filename :
637332
Link To Document :
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