DocumentCode :
3178215
Title :
Constructing Technological Distances from U.S. Patent Data
Author :
Franz, Jared S.
Author_Institution :
Univ. of Illinois at Chicago, Chicago
fYear :
2007
fDate :
19-20 Oct. 2007
Firstpage :
1
Lastpage :
2
Abstract :
This paper provides a general outline to construct technological distance measures from U.S. Patent data using a preliminary scoring method.
Keywords :
SQL; patents; technology management; U.S. patent data; preliminary scoring method; structured query language; technological distance measures; utility; Aggregates; Chemical technology; Chemistry; Database languages; Fertilizers; Measurement units; Paper technology; Programming; Research and development; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Science, Technology and Innovation Policy, 2007 Atlanta Conference on
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1774-2
Electronic_ISBN :
978-1-4244-1775-9
Type :
conf
DOI :
10.1109/ACSTIP.2007.4472903
Filename :
4472903
Link To Document :
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