Title :
2-die wafer-level chip scale packaging enables the smallest TCXO for mobile and wearable applications
Author :
Arumugam, Niveditha ; Hill, Ginel ; Clark, Guy ; Arft, Carl ; Grosjean, Charles ; Palwai, Rajkumar ; Pedicord, Jim ; Hagelin, Paul ; Partridge, Aaron ; Menon, Vinod ; Gupta, Pavan
Author_Institution :
SiTime Corp., Sunnyvale, CA, USA
Abstract :
Real-time clocking for space-constrained mobile and wearable applications require low-power 32.768 kHz references with small form-factor and tight frequency stability, at a competitive price built in an ultra-high volume capable manufacturing process. Legacy 32 kHz quartz-based technology has reached the limits of miniaturization, performance and cost. In this work, a temperature compensated 32 kHz MEMS-based oscillator (TCXO), in a 1.55 mm × 0.85 mm × 0.55 mm form factor, with ±5 ppm frequency stability over -40°C to 85°C, will be presented. The combination of wafer-level chip scale packaging (WL-CSP) and silicon MEMS technology has enabled the smallest and best-in-class 32 kHz clocking solution for very high volume applications. The underlying MEMS system packaging and test technologies will be presented along with the electrical and reliability results.
Keywords :
chip scale packaging; clocks; frequency stability; micromechanical devices; oscillators; quartz; wafer level packaging; MEMS system packaging; MEMS-based oscillator; TCXO; WL-CSP; frequency 32.768 kHz; frequency stability; microelectromechanical system; miniaturization performance; mobile application; quartz-based technology; real-time clocking; silicon MEMS technology; wafer-level chip scale packaging; wearable application; Application specific integrated circuits; Clocks; Electric shock; Micromechanical devices; Resonant frequency; Temperature measurement; Thermal stability;
Conference_Titel :
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location :
San Diego, CA
DOI :
10.1109/ECTC.2015.7159771