DocumentCode
3178263
Title
Dispersion measurement by white-light interferometry based on Fresnel reflections
Author
Rothwell, J.H. ; Flavin, D.A.
Author_Institution
Opt. Res. Group, Waterford Inst. of Technol., Ireland
fYear
2003
fDate
22-27 June 2003
Firstpage
496
Abstract
In this paper, we have demonstrated a white-light interferometric technique for characterisation of the dispersion, based on interferograms arising from Fresnel reflections at the sample surfaces. This technique has been shown to yield high-resolution measurements and has the potential for wide application in the characterisation of photonic materials.
Keywords
light interferometry; light reflection; optical dispersion; optical variables measurement; Fresnel reflections; dispersion measurement; photonic materials characterisation; white-light interferometry; Delay; Dispersion; Fast Fourier transforms; Fresnel reflection; Optical filters; Optical interferometry; Optical sensors; Phase measurement; Ultrafast optics; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Europe, 2003. CLEO/Europe. 2003 Conference on
Print_ISBN
0-7803-7734-6
Type
conf
DOI
10.1109/CLEOE.2003.1313559
Filename
1313559
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