DocumentCode :
3178272
Title :
A layer prediction method for minimum cost three dimensional integrated circuits
Author :
Hsueh, Tsu-Yun ; Yang, Hsiang-Hui ; Wu, Wei-Chieh ; Chi, Mely Chen
Author_Institution :
Dept. of Inf. & Comput. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
fYear :
2011
fDate :
14-16 March 2011
Firstpage :
1
Lastpage :
5
Abstract :
We propose a layer prediction method. It may be applied to automatically partition a gate-level netlist into a minimum cost 3D IC. The number of layers of the lowest cost 3D IC design is noted as Min_Cost_Layer of the design. We develop a multilevel multilayer partitioning program. It partitions a gate level netlist into a K-layer 3D IC structure. Its objective is to minimize the total number of TSVs under an area constraint. The program is applied to benchmark circuits to study the relation between the cost of 3D ICs and the number of partition layer K. The relation shows two classes of curves. One class shows “smiling” curves and the other shows “upward” curves. Our study shows the Min_Cost_Layer of a circuit depends on the ratio of total TSV area to the die area. We also find the upper bound of the Min_Cost_Layer. Therefore, we propose two methods: “Less_TSV” and “More_TSV” prediction methods. According to the processing technology and connectivity of a circuit, we select the appropriate method. The experimental results show that combining the Min_Cost_Layer prediction methods and the partitioning program, we can get the minimum cost 3D IC of a circuit effectively. For the 9 test circuits, on average, the cost of 3D implementations may save 13.74% compared with 2D implementations.
Keywords :
costing; integrated circuit design; three-dimensional integrated circuits; 3D integrated circuit design; Less_TSV prediction method; Min_Cost_Layer; More_TSV prediction method; automatic partitioning; gate level netlist; layer prediction method; minimum cost three dimensional integrated circuits; Design automation; Nonhomogeneous media; Partitioning algorithms; Prediction methods; Three dimensional displays; Through-silicon vias; Min_Cost_Layer prediction; Three dimensional integrated circuits partition; Through Silicon Via (TSV);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2011 12th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-61284-913-3
Type :
conf
DOI :
10.1109/ISQED.2011.5770751
Filename :
5770751
Link To Document :
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