DocumentCode
3178526
Title
Synthesis of an event based deadlock avoidance supervisor for semiconductor manufacturing systems with choices in process flows
Author
Zhang, Wenle ; Mao, Ziqiang John
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Ohio Univ., Athens, OH, USA
Volume
5
fYear
2004
fDate
14-17 Dec. 2004
Firstpage
4714
Abstract
With the emerging of highly automated and flexible manufacturing systems in semiconductor fabrication, reliability and optimal productivity of such systems require very intelligent and complex control systems. Deadlock issue arises easily in these systems due to shared equipment usage and high production flexibility. This paper extends the event-based deadlock avoidance supervisor for semiconductor manufacturing systems from scenario without choices in process flows to cases with choices which are common in modern manufacturing systems. To allow choices in process flows improves operational flexibility of these systems, it also requires more sophisticated supervisory control techniques. Built upon a directed graph model of process flows, the extended supervisor is able to efficiently avoid the deadlock state space explosion problem. Concepts such as compound events, operation strings and deadlock strings are restated. New concepts such as broken circuits, choice circuits, split events, merge events and so on are introduced. These concepts help to dramatically decrease the number of circuits that the supervisor has to check thus increasing efficiency of the method. Major features in the proposed method include: (i) it enables the optimal deadlock free operation of regular systems; and (ii) it runs in polynomial time (fast online computation) provided that the set of deadlock strings is calculated offline. Examples are provided to show the effectiveness of the method.
Keywords
directed graphs; discrete event systems; integrated circuit manufacture; broken circuits; choice circuits; complex control systems; compound events; deadlock strings; directed graph model; event based deadlock avoidance supervisor; intelligent control systems; merge events; operation strings; optimal productivity; process flows; reliability; semiconductor fabrication; semiconductor manufacturing systems; split events; Circuits; Control system synthesis; Fabrication; Flexible manufacturing systems; Intelligent control; Intelligent manufacturing systems; Manufacturing systems; Productivity; Semiconductor device reliability; System recovery;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 2004. CDC. 43rd IEEE Conference on
ISSN
0191-2216
Print_ISBN
0-7803-8682-5
Type
conf
DOI
10.1109/CDC.2004.1429535
Filename
1429535
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