Title :
X-Ray Diffraction & Residual Stresses in Ferroelectric Cathodes
Author :
Ravi, M. ; Bhat, K.S. ; Krupanidhi, S.B.
Author_Institution :
Minstry of Defence, Bangalore
Abstract :
In this paper we report an experimental study of electron emission from PLZT ceramic disc on application of high voltage excitation pulses and observed damage. Effect of 90deg domain switching on the internal stress developed in the ferroelectric sample has been studied through X-ray diffraction, d31 values were calculated from shift in XRD peaks.
Keywords :
X-ray diffraction; cathodes; electric domains; electron emission; ferroelectric ceramics; ferroelectric switching; internal stresses; lanthanum compounds; lead compounds; PLZT; X-ray diffraction; domain switching; electron emission; ferroelectric cathodes; ferroelectric ceramic disc; high-voltage excitation pulses; internal stress; residual stresses; Cathodes; Ceramics; Electron emission; Electron tubes; Ferroelectric materials; Iron; Residual stresses; Testing; X-ray diffraction; X-ray scattering; Electron Emission; XRD; ferroelectric cathodes;
Conference_Titel :
Vacuum Electronics Conference, 2007. IVEC '07. IEEE International
Conference_Location :
Kitakyushu
Print_ISBN :
1-4244-0633-1
DOI :
10.1109/IVELEC.2007.4283274
