DocumentCode
3178936
Title
Maximizing throughput of temperature-constrained multi-core systems with 3D-stacked cache memory
Author
Kang, Kyungsu ; Jung, Jongpil ; Yoo, Sungjoo ; Kyung, Chong-Min
Author_Institution
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
fYear
2011
fDate
14-16 March 2011
Firstpage
1
Lastpage
6
Abstract
Three-dimensional integration has the potential to increase integration density and to reduce communication latency of chip-multiprocessors (CMPs). However, high power density (i.e., power dissipation per unit volume) due to the high integration incurs temperature-related problems in reliability, power consumption, performance, and system cooling cost. In this paper, we propose a design-time solution for temperature-constrained multi-core systems with 3D stacked cache memory in order to maximize the instruction throughput. The proposed method combines power gating of memory banks in the 3D stacked cache memory, which adapts cache partitioning, and dynamic voltage and frequency scaling (DVFS) of each core in a temperature-aware manner. Experimental results show that the proposed method offers up to 32% (average 15%) performance improvement in terms of instructions per second (IPS) compared with an existing method which only performs cache partitioning without temperature consideration.
Keywords
cache storage; microprocessor chips; multiprocessing systems; power aware computing; 3D stacked cache memory; cache partitioning; chip multiprocessor; communication latency reduction; design time solution; dynamic voltage scaling; frequency scaling; instruction per second; instruction throughput maximization; integration density; memory bank; power consumption; power gating; system cooling cost; temperature-aware manner; temperature-constrained multicore system; three dimensional integration; Benchmark testing; Cache memory; Clocks; Multicore processing; Radio spectrum management; Thermal resistance; Three dimensional displays; 3D integration; Chip-multiprocessor; Dynamic voltage and frequency scaling; Power gating; Thermal management;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2011 12th International Symposium on
Conference_Location
Santa Clara, CA
ISSN
1948-3287
Print_ISBN
978-1-61284-913-3
Type
conf
DOI
10.1109/ISQED.2011.5770786
Filename
5770786
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