• DocumentCode
    3178973
  • Title

    ERAVC: Enhanced reliability aware NoC router

  • Author

    Neishaburi, M.H. ; Zilic, Zeljko

  • Author_Institution
    McGill Univ., Montreal, QC, Canada
  • fYear
    2011
  • fDate
    14-16 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The continuing advances in processing technology result in significant decreases in the feature size of integrated circuits. This shrinking leads to increases in susceptibility to transient errors and permanent faults. Network on Chips (NoCs) are poised to address the demands for high bandwidth communication among processing elements. The structural redundancy inherited in NoC-based design can be exploited to improve reliability and compensate for the effects of failures in digital systems. In this paper, we propose an enhanced fault tolerant micro-architecture for NoC routers. The proposed router supplies dynamic virtual channel allocation using Unified Buffer Structure (UBS) and History Aware Free-slot Tracker (HAFT). Plus, to reduce the associated performance costs of retransmissions in the case of failure, the proposed router employs a high-performance fault tolerant control flow, handling both transient and permanent faults without extra retransmission buffer requirements. Experimental results show a significant improvement in reliability as well as decreases in the average latency and energy consumption.
  • Keywords
    network-on-chip; reliability; ERAVC; average latency; digital system; dynamic virtual channel allocation; energy consumption; enhanced reliability aware NoC router; fault tolerant control flow; fault tolerant micro-architecture; history aware free-slot tracker; integrated circuit; network on chip; permanent fault; processing element; structural redundancy; susceptibility; transient error; unified buffer structure; Circuit faults; Fault tolerance; Fault tolerant systems; Routing; System-on-a-chip; Transient analysis; Network on Chip (NoC); Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2011 12th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-61284-913-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2011.5770788
  • Filename
    5770788