• DocumentCode
    3179510
  • Title

    Scaled LTPS TFTs for low-cost low-power applications

  • Author

    Kim, Soo Youn ; Baytok, Selin ; Roy, Kaushik

  • Author_Institution
    Purdue Univ., West Lafayette, IN, USA
  • fYear
    2011
  • fDate
    14-16 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Low-temperature polycrystalline-silicon thin-film transistors (LTPS TFTs) have emerged as a promising technology for applications such as low-cost sensor networks. In this paper, we propose a LTPS TFT device optimization methodology based on scaling of silicon body (Tsi) and buried oxide thickness (Tbox). The proposed approach is applicable for both digital and analog circuits. Results show that using the proposed device we can achieve 133X improvement in oscillation frequency of a three-stage ring oscillator (RO) and 31% improvement in operational amplifier (OPAMP) gain (Tsi =10nm and Tbox =10nm) compared to the traditional device structures. We believe that proper optimization of TFT device geometry parameters is necessary to realize low-power, high-performance, and low-cost LTPTS TFT digital & analog/RF circuits.
  • Keywords
    circuit optimisation; elemental semiconductors; low-power electronics; operational amplifiers; radiofrequency oscillators; silicon; thin film transistors; Si; analog-RF circuits; buried oxide thickness; digital circuits; low-cost low-power electronics; low-cost sensor networks; low-temperature polycrystalline-silicon thin-film transistors; opamp gain; operational amplifier; oscillation frequency; scaled LTPS TFT device optimization methodology; silicon body scaling; three-stage ring oscillator; Analog circuits; Capacitance; Logic gates; Performance evaluation; Silicon; Thin film transistors; BOX (buried oxide); Buried-oxide Induced Barrier Lowering (BIBL); Drain Induced Barrier Lowering (DIBL); Thin Film Transistor (TFT);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2011 12th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-61284-913-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2011.5770812
  • Filename
    5770812