DocumentCode
3179620
Title
Multi-mode redundancy removal
Author
Plaza, Stephen M. ; Saxena, Prashant ; Shiple, Thomas ; Ho, Pei-Hsin
Author_Institution
Janelia Farm Res. Campus, Ashburn, VA, USA
fYear
2011
fDate
14-16 March 2011
Firstpage
1
Lastpage
9
Abstract
Redundancy removal, i.e., identifying and eliminating redundant logic, is an essential optimization strategy for decreasing design area, reducing critical path delay, and simplifying circuit testability analysis. However, redundancy removal strategies invoke time-consuming proof engines with worst-case exponential behavior. While continual enhancements to heuristics resident in these engines result in large average runtime improvements, inherent intractability still leads to sub-optimal optimization and occasional large runtime outliers. Such outliers are unacceptable in an industrial setting where an outlier compromises design turnaround time. Our work introduces a semi-local optimization algorithm that mitigates the inherent intractability in redundancy removal and eliminates crippling runtime outliers. We further embed this algorithm within a framework that minimizes any negative impact to delay and area metrics. Using the cutting-edge Synopsys® Design Compiler® logic synthesis tool, we demonstrate 1) statistical neutrality in area and timing while achieving consistent runtime improvements on a large set of proprietary circuit designs of varying type and complexity and 2) over 50% runtime improvement on a suite of computationally intractable industrial designs, even when measured at the end of the physical synthesis flow.
Keywords
circuit optimisation; circuit testing; electronic design automation; logic design; network synthesis; redundancy; circuit design; circuit testability analysis; critical path delay reduction; cutting-edge Synopsys design compiler logic synthesis tool; multimode redundancy removal; optimization strategy; proof engines; redundant logic elimination; redundant logic identification; semilocal optimization algorithm; statistical neutrality; suboptimal optimization; Algorithm design and analysis; Circuit faults; Engines; Heuristic algorithms; Optimization; Redundancy; Runtime;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2011 12th International Symposium on
Conference_Location
Santa Clara, CA
ISSN
1948-3287
Print_ISBN
978-1-61284-913-3
Type
conf
DOI
10.1109/ISQED.2011.5770819
Filename
5770819
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