• DocumentCode
    3179689
  • Title

    Software reliability analysis with optimal release problems based on hazard rate model for an embedded OSS

  • Author

    Tamura, Yoshinobu ; Yamada, Shigeru

  • Author_Institution
    Grad. Sch. of Sci. & Eng., Yamaguchi Univ., Ube, Japan
  • fYear
    2010
  • fDate
    10-13 Oct. 2010
  • Firstpage
    720
  • Lastpage
    726
  • Abstract
    An OSS (open source software) system is frequently applied as server use, instead of client use. Especially, embedded OSS systems have been gaining a lot of attention in the embedded system area, i.e., Android, BusyBox, TRON, etc. However, the poor handling of quality problem and customer support prohibit the progress of embedded OSS. Also, it is difficult for developers to assess the reliability and portability of embedded OSS on a single-board computer. We focus on software quality/reliability problems that can prohibit the progress of embedded OSS. In this paper, we propose a method of software reliability assessment based on a hazard rate model for the embedded OSS. In particular, we derive several assessment measures from the model. Also, we analyze actual software failure-occurrence time-interval data to show numerical examples of software reliability assessment for the embedded OSS. Moreover, we discuss the optimal software release problem for the porting-phase based on the total expected software maintenance cost.
  • Keywords
    embedded systems; public domain software; software fault tolerance; software maintenance; software portability; software quality; software reliability; embedded OSS system; hazard rate model; open source software system; optimal software release problem; single-board computer; software failure-occurrence time-interval data; software maintenance cost; software portability; software quality; software reliability assessment analysis; Computational modeling; Nickel; Reliability; Embedded system; Modeling; Open source software; Optimal release problem; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems Man and Cybernetics (SMC), 2010 IEEE International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1062-922X
  • Print_ISBN
    978-1-4244-6586-6
  • Type

    conf

  • DOI
    10.1109/ICSMC.2010.5641839
  • Filename
    5641839