DocumentCode :
3180201
Title :
Effect of film thickness on structural and optical properties of TiO2 thin films
Author :
Malliga, P. ; Pandiarajan, J. ; Prithivikumaran, N. ; Neyvasagam, K.
Author_Institution :
Dept. of Phys., V.V. Vanniaperumal Coll. for Women, Virudhunagar, India
fYear :
2013
fDate :
24-26 July 2013
Firstpage :
488
Lastpage :
491
Abstract :
Titanium Dioxide (TiO2) thin films have been prepared from solution of TTIP (Titanium Tetra Isopropoxide), acetic acid and ethanol on glass substrates by sol - gel dip coating technique. The films coated for different coating cycles were annealed at a temperature of 450°C for one hour. The annealed films were characterized by X - Ray diffraction (XRD) method, UV - Visible and Photoluminescence (PL) spectroscopy, Field Effect Scanning Electron Microscopy (FESEM) and Energy Dispersive X - Ray Analysis (EDAX). From XRD analysis, the crystallite size was found to increase from 19.4 nm to 71.3 nm and the phase changes from anatase to rutile with increase in the number of coating cycles. The TiO2 thin films have high transparency in the visible range.The transmittance and the optical band gap found to reduce with increase in number of coating cycles. The PL spectra of TiO2films have two peaks at 485 nm and 530 nm and intensity increases with increase in coating cycles. Surface morphology from FESEM images reveal that the films are becoming denser and roughness increases with increase in the number of coating cycles. These results suggest that the nanocrystalline TiO2 thin films are attractive material for photo catalytic applications.
Keywords :
X-ray chemical analysis; X-ray diffraction; annealing; crystallites; dip coating; energy gap; field emission electron microscopy; nanofabrication; nanostructured materials; optical constants; photoluminescence; scanning electron microscopy; semiconductor growth; semiconductor thin films; sol-gel processing; solid-state phase transformations; surface morphology; surface roughness; transparency; ultraviolet spectra; visible spectra; EDAX; FESEM; SiO2; TiO2; X-ray diffraction; XRD; acetic acid; anatase-rutile phase change; annealing; coating cycles; crystallite size; energy dispersive X-ray analysis; ethanol; field emission scanning electron microscopy; film thickness effect; glass substrates; nanocrystalline thin films; optical band gap; optical properties; photocatalytic applications; photoluminescence spectroscopy; roughness; size 19.4 nm to 71.3 nm; sol-gel dip coating; structural properties; surface morphology; temperature 450 degC; time 1 h; titanium dioxide thin films; titanium tetra isopropoxide solution; transmittance; transparency; ultraviolet-visible spectroscopy; Coatings; Crystals; Integrated optics; Optical films; Photoluminescence; System-on-chip; FESEMand EDAX; PL; Sol - Gel Process; TiO2 thin film; UV-Visible; XRD;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Nanomaterials and Emerging Engineering Technologies (ICANMEET), 2013 International Conference on
Conference_Location :
Chennai
Print_ISBN :
978-1-4799-1377-0
Type :
conf
DOI :
10.1109/ICANMEET.2013.6609344
Filename :
6609344
Link To Document :
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